A New Focused Ion Beam Optical System for a Time-of-flight-Secondary Ion Mass Spectrometry Instrument

Author(s):  
H. Shichi ◽  
S. Osabe ◽  
K. Kanehori
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pp. 4500-4506 ◽  
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Ichiro Mihara ◽  
Martin P. Seah ◽  
Gustavo Ferraz Trindade ◽  
Felix Kollmer ◽  
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2003 ◽  
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Nicholas Lockyer ◽  
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Nanomaterials ◽  
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Vol 8 (1) ◽  
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Author(s):  
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Julia Böttner ◽  
Antje Vennemann ◽  
Daniel Breitenstein ◽  
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