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A New Focused Ion Beam Optical System for a Time-of-flight-Secondary Ion Mass Spectrometry Instrument
Rapid Communications in Mass Spectrometry
◽
10.1002/(sici)1097-0231(19970131)11:2<175::aid-rcm725>3.0.co;2-k
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1997
◽
Vol 11
(2)
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pp. 175-178
◽
Cited By ~ 4
Author(s):
H. Shichi
◽
S. Osabe
◽
K. Kanehori
Keyword(s):
Mass Spectrometry
◽
Optical System
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Focused Ion Beam
◽
Secondary Ion Mass Spectrometry
◽
Ion Beam
◽
Time Of Flight
◽
Mass Spectrometry Instrument
◽
Ion Mass Spectrometry
◽
Secondary Ion
Download Full-text
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Comparison of the Spectra of LiCoO2, CoO, and Co3O4 by Time-of-Flight Secondary Ion Mass Spectrometry with Focused Ion Beam (FIB-TOF-SIMS)
Journal of the Vacuum Society of Japan
◽
10.3131/jvsj2.56.122
◽
2013
◽
Vol 56
(4)
◽
pp. 122-124
◽
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Author(s):
Miwa OHNISHI
◽
Osamu MATSUOKA
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Secondary Ion Mass Spectrometry
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Ion Beam
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◽
Tof Sims
◽
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Combined electron and focused ion beam system for improvement of secondary ion yield in secondary ion mass spectrometry instrument
Applied Physics Letters
◽
10.1063/1.2362996
◽
2006
◽
Vol 89
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◽
pp. 164103
◽
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Author(s):
L. Ji
◽
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◽
K.-N. Leung
◽
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Keyword(s):
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Focused Ion Beam
◽
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Ion Beam
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Mass Spectrometry Instrument
◽
Beam System
◽
Ion Mass Spectrometry
◽
Secondary Ion
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Practical Aspects of Focused Ion Beam Time-of-Flight Secondary Ion Mass Spectrometry Analysis Enhanced by Fluorine Gas Coinjection
Chemistry of Materials
◽
10.1021/acs.chemmater.1c00052
◽
2021
◽
Author(s):
Krzysztof Wieczerzak
◽
Agnieszka Priebe
◽
Ivo Utke
◽
Johann Michler
Keyword(s):
Mass Spectrometry
◽
Focused Ion Beam
◽
Secondary Ion Mass Spectrometry
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Mass Spectrometry Analysis
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Spectrometry Analysis
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Improvement of sensitivity using principal component analysis by dual focused ion beam time-of-flight secondary ion mass spectrometry
Applied Surface Science
◽
10.1016/j.apsusc.2008.05.078
◽
2008
◽
Vol 255
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◽
pp. 1052-1054
◽
Cited By ~ 2
Author(s):
Yoshihiro Morita
◽
Masanori Owari
Keyword(s):
Mass Spectrometry
◽
Principal Component Analysis
◽
Focused Ion Beam
◽
Secondary Ion Mass Spectrometry
◽
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◽
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◽
Component Analysis
◽
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Chemical Imaging of Buried Interfaces in Organic–Inorganic Devices Using Focused Ion Beam-Time-of-Flight-Secondary-Ion Mass Spectrometry
ACS Applied Materials & Interfaces
◽
10.1021/acsami.8b15091
◽
2019
◽
Vol 11
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◽
pp. 4500-4506
◽
Cited By ~ 2
Author(s):
Mariavitalia Tiddia
◽
Ichiro Mihara
◽
Martin P. Seah
◽
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◽
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◽
...
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Mass Spectrometry
◽
Focused Ion Beam
◽
Secondary Ion Mass Spectrometry
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◽
Time Of Flight
◽
Chemical Imaging
◽
Buried Interfaces
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Three-Dimensional Image of Cleavage Bodies in Nuclei Is Configured Using Gas Cluster Ion Beam with Time-of-Flight Secondary Ion Mass Spectrometry
Scientific Reports
◽
10.1038/srep10000
◽
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◽
Vol 5
(1)
◽
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Author(s):
Noritaka Masaki
◽
Itsuko Ishizaki
◽
Takahiro Hayasaka
◽
Gregory L. Fisher
◽
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◽
...
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Mass Spectrometry
◽
Secondary Ion Mass Spectrometry
◽
Ion Beam
◽
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◽
Time Of Flight
◽
Dimensional Image
◽
Ion Mass Spectrometry
◽
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Gas Cluster Ion Beam
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A C60Primary Ion Beam System for Time of Flight Secondary Ion Mass Spectrometry: Its Development and Secondary Ion Yield Characteristics
Analytical Chemistry
◽
10.1021/ac026338o
◽
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◽
Vol 75
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◽
pp. 1754-1764
◽
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◽
Steve Wong
◽
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◽
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Mass Spectrometry
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Combined Secondary Ion Mass Spectrometry Depth Profiling and Focused Ion Beam Analysis of Cu Films Electrodeposited under Oscillatory Conditions
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◽
10.1002/celc.201402427
◽
2015
◽
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◽
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Focused Ion Beam
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Nanomaterials
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Lothar Veith
◽
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Antje Vennemann
◽
Daniel Breitenstein
◽
Carsten Engelhard
◽
...
Keyword(s):
Mass Spectrometry
◽
Lung Tissue
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Secondary Ion Mass Spectrometry
◽
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◽
Time Of Flight
◽
Zro2 Nanoparticles
◽
Tissue Sections
◽
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Secondary Ion
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Secondary ion mass spectrometry depth profiling of nanometer-scale p+-n junctions fabricated by Ga+ focused ion beam implantation
Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena
◽
10.1116/1.586355
◽
1992
◽
Vol 10
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◽
pp. 333
◽
Cited By ~ 14
Author(s):
Steven W. Novak
Keyword(s):
Mass Spectrometry
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Focused Ion Beam
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Secondary Ion Mass Spectrometry
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Ion Beam
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Depth Profiling
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Nanometer Scale
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Ion Beam Implantation
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Secondary Ion
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